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Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals

著者名:
掲載資料名:
Space processing of materials : 4-5 August 1996, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2809
発行年:
1996
開始ページ:
45
終了ページ:
56
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421975 [0819421979]
言語:
英語
請求記号:
P63600/2809
資料種別:
国際会議録

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