Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction
- 著者名:
- 掲載資料名:
- European powder diffraction : EPDIC IV : proceedings of the Fourth European Powder Diffraction Conference, held in Chester, England, July 1995
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 228-231
- 発行年:
- 1996
- パート:
- 1
- 開始ページ:
- 301
- 終了ページ:
- 306
- 出版情報:
- Zuerich-Uetikon, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497423 [0878497420]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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