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Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction

著者名:
掲載資料名:
European powder diffraction : EPDIC IV : proceedings of the Fourth European Powder Diffraction Conference, held in Chester, England, July 1995
シリーズ名:
Materials science forum
シリーズ巻号:
228-231
発行年:
1996
パート:
1
開始ページ:
301
終了ページ:
306
出版情報:
Zuerich-Uetikon, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497423 [0878497420]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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