X-Ray Diffraction Characterization of Thin Superconductive Films

X-Ray Diffraction Characterization of Thin Superconductive Films

著者名:

掲載資料名:

Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995

シリーズ名:

Materials science forum

シリーズ巻号:

210-213

発行年:

1996

パート:

1

開始ページ:

203

終了ページ:

210

出版情報:

Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878497089 [0878497080]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020691
シリーズID:	PA00000012
会議名:	International Symposium on Nondestructive Characterization of Materials
回次:	7th
会議開催地:	Prague, Czech Republic
会議開催年:	1995.06.00

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