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Information as a quality metric for high-resolution imaging

著者名:
掲載資料名:
Very high resolution and quality imaging III : 30 January, 1998, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3308
発行年:
1998
開始ページ:
16
終了ページ:
27
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427489 [0819427489]
言語:
英語
請求記号:
P63600/3308
資料種別:
国際会議録

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