Depth from physics: develpoment of a robust classifier for 2D image analysis

著者名:

• Hattery,D.W. ( Institute for Medical Imaging and Image Analysis/George Washington Univ. )
• Loew,M.H. ( Institute for Medical Imaging and Image Analysis/George Washington Univ. )
• Wick,C.E. ( U.S. Naval Academy )

掲載資料名:

Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3338

発行年:

1998

巻:

Part 1

開始ページ:

762

終了ページ:

773

出版情報:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819427830 [0819427837]

言語:

英語

請求記号:

P63600/3338

資料種別:

国際会議録