Testing method on nanometer-grade true microprofile of optical surface (Invited Paper)
- 著者名:
Li,J. ( Jiangxi Academy of Sciences (China) ) Li,X. ( Jiangxi Academy of Sciences (China) ) Ying,A. ( Jiangxi Academy of Sciences (China) ) Xiao,S. ( Nanchang Univ.(China) ) Wang,M. ( Nanchang Univ.(China) ) Zhao,A. ( Jiangxi Academy of Sciences (China) ) - 掲載資料名:
- Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3557
- 発行年:
- 1998
- 開始ページ:
- 276
- 終了ページ:
- 281
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819430182 [0819430188]
- 言語:
- 英語
- 請求記号:
- P63600/3557
- 資料種別:
- 国際会議録
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