"Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitrde Tips"
- 著者名:
Moers P. H. M. Tack G. R. Noordman J. F. O. Segerink B. F. van Hulst F. N. Bolger B. - 掲載資料名:
- Near field optics
- シリーズ名:
- NATO ASI series. Series E, Applied sciences
- シリーズ巻号:
- 242
- 発行年:
- 1993
- 開始ページ:
- 79
- 終了ページ:
- 86
- 総ページ数:
- 8
- 出版情報:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792323945 [0792323947]
- 言語:
- 英語
- 請求記号:
- N11482/242
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
Kluwer Academic Publishers |
8
国際会議録
Precision carbon nanotube tip for critical dimension measurement with atomic force microscope
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Kluwer Academic Publishers |
Society of Photo-optical Instrumentation Engineers |
Kluwer Academic Publishers |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Kluwer Academic Publishers |