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Reliability of short channel silicon SOI VSI Devices and Circuits

著者名:
Ioannou E. D. ( University of Maryland, U. S. A. )  
掲載資料名:
Semiconductor device reliability
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
175
発行年:
1990
開始ページ:
507
終了ページ:
516
総ページ数:
10
出版情報:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792305361 [0792305361]
言語:
英語
請求記号:
N11482/175
資料種別:
国際会議録

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