An Experimental and Theoretical Investigation of Degradation in Semiconductor Lasers Resulting from Electrostatic Discharge

An Experimental and Theoretical Investigation of Degradation in Semiconductor Lasers Resulting from Electrostatic Discharge

著者名:

Dechiaro F. L. ( Bell Communications Research, U. S. A. )
Brick-Podriguez D. C. ( South Central Bell, U. S. A. )
Chemelli G. R.
Krupsky W. J.

掲載資料名:

Semiconductor device reliability

シリーズ名:

NATO ASI series. Series E, Applied sciences

シリーズ巻号:

175

発行年:

1990

開始ページ:

379

終了ページ:

411

総ページ数:

33

出版情報:

Dordrecht: Kluwer Academic Publishers

ISSN:

0168132X

ISBN:

9780792305361 [0792305361]

言語:

英語

請求記号:

N11482/175

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020566
シリーズID:	PA00000018
会議名:	NATO Advanced Research Workshop on Semiconductor Device Reliability
回次:	1989
会議開催地:	Heraklio, Crete, Greece
会議開催年:	1989.06.04-1989.06.09

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