Blank Cover Image

Partially strained Si1-xGex/Si structures investigated by photoreflectance spectroscopy

著者名:
掲載資料名:
Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3725
発行年:
1999
開始ページ:
214
終了ページ:
217
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431998 [0819431990]
言語:
英語
請求記号:
P63600/3725
資料種別:
国際会議録

類似資料:

1 国際会議録 Photoreflectance investigations of AlxGa1-xAs/GaAs bandgap dependence on Al content

Sitarek,P., Misiewicz,J., Veje,E.

SPIE - The International Society for Optical Engineering
7 国際会議録 Photoreflectance investigation of δ-doped MOVPE-grown AlxGa1-xAs layers

Nowaczyk-Utko,M., Sek,G., Misiewicz,J., Sciana,B., Radziewicz,D., Tlaczala,M.J.

SPIE-The International Society for Optical Engineering
2 国際会議録 Photoreflectance spectroscopy for semiconductor structure investigations

Misiewicz,J.

SPIE-The International Society for Optical Engineering
8 国際会議録 Thermal Stability of Strained Si on Relaxed Si1-xGex Buffer Layers

Mooney, P.M., Koester, S.J., Ott, J.A., Jordan-Sweet, J.L., Chu, J.O., Chan, K.K.

Materials Research Society
3 国際会議録 Photoreflectance spectroscopy for investigations of semiconductor structures (Invited Paper)

Misiewicz,J.

SPIE-The International Society for Optical Engineering
9 国際会議録 Scanning tunneling spectroscopy investigation of the strained Si1-xGex-on-Si band offsets

Chen, Xiangdong, Wang, Xiang-Dong, Liu, Kou-Chen, Kim, Dong-Won, Banerjee, Sanjay

MRS-Materials Research Society
4 国際会議録 2D hole gas in GaAs/(AIGs)As heterostructures investigated by photoreflectance apectroscopy

Sitarek,P., Misiewicz,J., Hansen,O. P.

SPIE-The International Society for Optical Engineering
10 国際会議録 ONSET OF MISFIT DISLOCATION GENERATION IN AS-GROWN AND ANNEALED Si1-xGex/Si FILMS

Scott, M.P., Landerman,S.S., Kamins, T.I., Rosner, S.J., Nauka, K., Noble, D.B., Hoyt, J.L., King, C.A., Gronet, C.M., …

Materials Research Society
5 国際会議録 GaAs/AIGaAs complex structures examined by photoreflectance spectroscopy

Sek,G., Misiewicz,J., Kaniewska,M., Reginski,K., Muszalski,J.

SPIE-The International Society for Optical Engineering
11 国際会議録 Photoreflectance and photoluminescence of InGaAs/GaAs structures

Misiewicz,J., Ciorga,M., Sek,G., Bryja,L., Radziewicz,D., Korbutowicz,R., Panek,M., Tlaczala,M. J.

SPIE-The International Society for Optical Engineering
6 国際会議録 Photoreflectance spectroscopy of metalorganic chemical vapor deposition (MOCVD)-grown GaAs and GaAs/GaAlAs structures

J. Misiewicz, K. Jezierski, P. Sitarck, P. Markiewicz, R. Korbutowic

Society of Photo-optical Instrumentation Engineers
12 国際会議録 PHOTOLUMINESCENCE FROM COHERENTLY STRAINED Si1-XGeX ALLOYS

Rowell, N. L., Noel, J.-P., Houghton, D. C., Perovic, D. D.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12