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Absolute calibration of ACIS x-ray CCDs using calculable undispersed synchrotron radiation

著者名:
Bautz,M.W. ( Massachusetts Institute of Technology )
Pivovaroff,M.J.
Kissel,S.E.
Prigozhin,G.Y.
Isobe,T.
Jones,S.E.
Ricker,G.R.
Thornagel,R.
Kraft,S.
Scholze,F.
Ulm,G.
さらに 6 件
掲載資料名:
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4012
発行年:
2000
開始ページ:
53
終了ページ:
67
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436375 [0819436372]
言語:
英語
請求記号:
P63600/4012
資料種別:
国際会議録

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