Comparison of Valence-Band Tunneling in Pure SiO2, Composite SiO2/Ta2O5, and Pure Ta2O5, in MOSFETs With 1.0 nm-Thick SiO2-Equivalent Gate Dielectrics
- 著者名:
Shanware, A. Massoud, H. Z. Vogel, E. Henson, K. Hauser, J. R. Wortman, J. J. - 掲載資料名:
- Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 567
- 発行年:
- 1999
- 開始ページ:
- 515
- 出版情報:
- Warrendale, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994744 [1558994742]
- 言語:
- 英語
- 請求記号:
- M23500/567
- 資料種別:
- 国際会議録
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