HIGH-RESOLUTION X-RAY DIFFRACTION MEASUREMENTS OF SiGe/Si STRUCTURES

HIGH-RESOLUTION X-RAY DIFFRACTION MEASUREMENTS OF SiGe/Si STRUCTURES

著者名:

掲載資料名:

Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

375

発行年:

1995

開始ページ:

201

出版情報:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992771 [1558992774]

言語:

英語

請求記号:

M23500/375

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020301
シリーズID:	PA00000011
会議名:	Symposium on applications of synchrotron radiation techniques to materials science
回次:	2nd
会議開催地:	Boston, MA, USA
会議開催年:	1994.11.27-1994.12.02

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