Blank Cover Image

Novel functional nortricyclene polymers and copolymers for 248-and 193-nm chemically amplified resists

著者名:
掲載資料名:
Advances in resist technology and processing XIV : 10-12 March 1997, Santa Clara, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3049
発行年:
1997
開始ページ:
113
終了ページ:
123
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424631 [0819424633]
言語:
英語
請求記号:
P63600/3049
資料種別:
国際会議録

類似資料:

Okoroanyanwu,U., Shimokawa,T., Byers,J.D., Medeiros,D.R., Willson,C.G., Niu,Q.J., Frechet,J.M.J., Allen,R.D.

SPIE-The International Society for Optical Engineering

Tully,D.C., Trimble,A.R., Frechet,J.M.J.

SPIE - The International Society for Optical Engineering

Okoroanyanwu,U., Byers,J.D., Cao,T., Webber,S.E., Willson,C.G.

SPIE-The International Society for Optical Engineering

Klopp,J.M., Pasini,D., Frechet,J.M.J., Byers,J.D.

SPIE - The International Society for Optical Engineering

Patterson,K., Okoroanyanwu,U., Shimokawa,T., Cho,S., Byers,J.D., Willson,C.G.

SPIE-The International Society for Optical Engineering

Yamada,S., Medeiros,D.R., Patterson,K., Jen,W.-L.K., Rager,T., Lin,Q., Lenci,C., Byers,J.D., Havard,J.M., Pasini,D., …

SPIE-The International Society for Optical Engineering

4 国際会議録 Negative-tone 193-nm resists

Cho,S., Heyden,A.Vander, Byers,J.D., Willson,C.G.

SPIE - The International Society for Optical Engineering

Pasini, D., Low, E., Meagley, R. P., Frechet, J. M. J., Willson, C. G., Byers, J. D.

SPIE - The International Society of Optical Engineering

Willson,C.G., Yueh,W., Leeson,M.J., Steinhasler,T., McAdams,C.L., Dammel,R.R., Sounik,J.R., Aslam,M., Vicari,R., …

SPIE-The International Society for Optical Engineering

Okoroanyanwu, Uzodinma, Byers, Jeffrey D., Cao, Ti, Webber, Stephen E., Willson, C. Grant

American Chemical Society

Leeson,M.J., Pawloski,A., Levering,V., Yueh,W., Willson,C.G.

SPIE-The International Society for Optical Engineering

Lin,Q., Simpson,L.L., Steinhausler,T., Wilder,M., Willson,C.G., Havard,J., Frechet,J.M.J.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12