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Gradient-based Hough transform for the detection and characterization of defects during nondestructive inspection

著者名:
Voon,L.F.C.Lew Yan ( Univ.de Bourgogne )
Bolland,P.
Laligant,O.
Gorria,P.
Gremillet,B.
Pillet,L.
さらに 1 件
掲載資料名:
Machine Vision Applications in Industrial Inspection V
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3029
発行年:
1997
開始ページ:
140
終了ページ:
146
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424402 [0819424404]
言語:
英語
請求記号:
P63600/3029
資料種別:
国際会議録

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