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Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectance surfaces

著者名:
Edgar,M.L. ( Univ.of California/Berkeley )
Cully,S.L.
Jelinsky,S.R.
Jelinsky,P.N.
Siegmund,O.H.W.
Warren,J.K.
さらに 1 件
掲載資料名:
EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2808
発行年:
1996
開始ページ:
313
終了ページ:
324
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421968 [0819421960]
言語:
英語
請求記号:
P63600/2808
資料種別:
国際会議録

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