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Finite Element Model Update Via Bayesian Estimation and Minimization of Dynamic Residuals

著者名:
Alvin,K.F. ( Sandia National Laboratories )  
掲載資料名:
Proceedings of the 14th International Modal Analysis Conference February 12-15, 1996 Hyatt Regency Dearborn Hotel Dearborn, Michigan
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2768
発行年:
1996
開始ページ:
561
終了ページ:
567
出版情報:
Bethel, CT: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780912053493 [0912053496]
言語:
英語
請求記号:
P63600/2768
資料種別:
国際会議録

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