Modal Analysis of The Chinese Standard Structure Using Varied Excitation Methods

Modal Analysis of The Chinese Standard Structure Using Varied Excitation Methods

著者名:

Luk,Y.W. ( Zonic Corporation )

掲載資料名:

Proceedings of the 14th International Modal Analysis Conference February 12-15, 1996 Hyatt Regency Dearborn Hotel Dearborn, Michigan

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2768

発行年:

1996

開始ページ:

8

終了ページ:

15

出版情報:

Bethel, CT: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780912053493 [0912053496]

言語:

英語

請求記号:

P63600/2768

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020267
シリーズID:	PA00000029
会議名:	International Modal Analysis Conference
回次:	14th
会議開催地:	Dearborn, MI, USA
会議開催年:	1996.02.12-1996.02.15

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