X-ray diffraction optics of the submicron surface layers

X-ray diffraction optics of the submicron surface layers

著者名:

掲載資料名:

International Conference on Holography and Correlation Optics : 15-19 May 1995, Chernovtsy, Ukraine

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2647

発行年:

1995

開始ページ:

385

終了ページ:

389

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420206 [0819420204]

言語:

英語

請求記号:

P63600/2647

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020255
シリーズID:	PA00000029
会議名:	Correlation Optics : International Conference on Holography and Correlation Optics
回次:	1995
会議開催地:	Chernovtsy, Ukraine
会議開催年:	1995.05.15-1995.05.19

類似資料:

1 国際会議録 Applied possibilities for x-ray diffraction interferometry Raransky,M.D., Struk,Ja.M., Fodchuk,I.M., Shafraniuk,V.P., Raransky,A.M. SPIE-The International Society for Optical Engineering	7 国際会議録 The Effect of the Field of Residual Strains on the N-Beam X-Ray Diffraction on Diamond Tkach, V.N., Borcha, M.D., Fodchuk, I.M., Tkach, O.O., Kshevetsky, O.S. Springer
2 国際会議録 New principles of diagnostics of surface parameters of solids by methods of x-ray total external reflection Balovsyak, S. V., Fodchuk, I. M. SPIE - The International Society of Optical Engineering	8 国際会議録 New Possibilities of X-Ray Diffraction Methods in Structure Investigations of Multilayer Materials Bonarski,J.T., Swiatek,Z., Ciach,R., Kuznicki,Z.T., Fodchuk,I.M. Trans Tech Publications
3 国際会議録 Unusual multiple x-ray transmissions in crystals with one-dimensional strains Fodchuk,I.M., Raransky,M.D., Borcha,M.D., Cultaj,L.L., Krytsun,I.I. SPIE - The International Society for Optical Engineering	9 国際会議録 Pendellosung fringes in distorted crystals Raransky,M.D., Fodchuk,I.M., Struk,Ya.M., Bobrovnik,S.V. SPIE - The International Society for Optical Engineering
4 国際会議録 Formation features of microdefect x-ray topography images in silicon crystals Fodchuk,I.M., Raransky,M.D., Novikov,S.M., Marmus,P.E., Bobrovnik,S.V. SPIE - The International Society for Optical Engineering	10 国際会議録 Structural changes in silicon implanted by phosphorus Fodchuk,I.M., Raransky,M.D., Gimchinsky,O.G., Codovaniouk,V.M., Guitaj,L.L., Swiatek,Z., Bonarsky,J.N. SPIE - The International Society for Optical Engineering
5 国際会議録 Coincidental multiple x-ray diffraction as tool for precise investigation of crystals M. Borcha, I. Fodchuk, O. Kroitor, Ya. Garabazhiv, O. Kshevetsky Society of Photo-optical Instrumentation Engineers	11 国際会議録 Defect structure changes in the single Si-crystals after irradiation by high-energy electrons and long natural aging by high-resolution three-crystal x-ray … V. V. Dovganyuk, T. V. Lytvynchuk, V. V. Slobodyan, M. I. Fodchuk Society of Photo-optical Instrumentation Engineers
6 国際会議録 Peculiarities of MCT ion etching in rf mercury glow discharge Savitsky,V.G., Mansurov,L.G., Fodchuk,I.M., Izhnin,I.I., Virt,I., Lozynska,M., Evdokimenko,A.V. SPIE - The International Society for Optical Engineering	12 国際会議録 Diffraction geometry optimization with polycapillary x-ray optics Gibson,W.M., MacDonald,C.A., Ullrich,J.B. SPIE - The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12