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The Metastable Si:(S + Cu)Defect

著者名:
Jeyanathan,L.
Davies,G.
Lightowlers,E.C.
Singh,M.
Sun,H.J.
Ittermann,B.
Ostapenko,S.S.
Barry,W.A.
Mason,P.
Watkins,G.D.
さらに 5 件
掲載資料名:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
シリーズ名:
Materials science forum
シリーズ巻号:
143-147
発行年:
1994
巻:
Pt.2
開始ページ:
1167
終了ページ:
1172
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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