Determination of the Decay Rate of Photoionized Te Atoms Implanted in GaAs and Al 3Ga 7As by Mossbauer Spectroscopy
- 著者名:
- 掲載資料名:
- Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 143-147
- 発行年:
- 1994
- 巻:
- Pt.2
- 開始ページ:
- 1105
- 終了ページ:
- 1110
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878496716 [0878496718]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Kluwer Academic Publishers |
North Holland |
2
国際会議録
Mossbauer Study of the Electronic and Vibrational Properties of Implanted Te in GaAs and AlxGal-XAS
Trans Tech Publications |
Trans Tech Publications |
Materials Research Society |
MRS - Materials Research Society |
North-Holland |
MRS - Materials Research Society |
North Holland |
Kluwer Academic Publishers |
Plenum Press |
Martinus Nijhoff Publishers |