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PL and EPR Studies of Er-Implanted FZ- and CZ-Si

著者名:
Przybylinska,H.
Enzenhofer,J.
Hendorfer,G.
Schoisswohl,M.
Palmetshofer,L.
Jantsch,W.
さらに 1 件
掲載資料名:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
シリーズ名:
Materials science forum
シリーズ巻号:
143-147
発行年:
1994
巻:
Pt.2
開始ページ:
715
終了ページ:
720
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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