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APPLICATION OF OPTICALLY DETECTED MAGNETIC RESONANCE TO THE CHARACTERIZATION OF POINT DEFECTS IN SEMICONDUCTORS.

著者名:
SPAETH,J.-M.  
掲載資料名:
Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986
シリーズ名:
Materials science forum
シリーズ巻号:
10-12
発行年:
1986
巻:
Part2
開始ページ:
505
終了ページ:
514
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495511 [0878495517]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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