Method of one-dimensional optoelectronic high-speed detection on two-dimensional temperature field

著者名:

• Wang,Q. ( Beijing Institute of Technology (China) )
• Chang,J. ( Beijing Institute of Technology (China) )
• Jiang,J. ( Beijing Institute of Technology (China) )
• Liu,X. ( Beijing Institute of Technology (China) )

掲載資料名:

Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3558

発行年:

1998

開始ページ:

105

終了ページ:

109

出版情報:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819430199 [0819430196]

言語:

英語

請求記号:

P63600/3558

資料種別:

国際会議録