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Microstructural study of CMR films as a function of growth temperature, as-deposited and annealed

著者名:
Hawley, M.E. ( Center for Materials Science )
Wu, X.D. ( Superconductivity Technology Center )
Arendt, P.N. ( MST-7 )
Adams, C.D. ( MST-7 )
Hundley, M.F. ( MST-10 )
Heffner, R.H. ( MST-10 )
さらに 1 件
掲載資料名:
Epitaxial oxide thin films II : symposium held November 26-30, 1995, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
401
発行年:
1996
開始ページ:
531
終了ページ:
536
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558993044 [1558993045]
言語:
英語
請求記号:
M23500/401
資料種別:
国際会議録

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