Imaging of Extended Defects by Quenched Infra-red Beam Induced Currents ( Q-IRBIC )

Imaging of Extended Defects by Quenched Infra-red Beam Induced Currents ( Q-IRBIC )

著者名:

掲載資料名:

Point and extended defects in semiconductors

シリーズ名:

NATO ASI series. Series B, Physics

シリーズ巻号:

202

発行年:

1989

開始ページ:

257

終了ページ:

268

総ページ数:

12

出版情報:

New York: Plenum Press

ISBN:

9780306433368 [0306433367]

言語:

英語

請求記号:

N11479/202

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020005
シリーズID:	PA00000015
会議名:	NATO Advanced research workshop on on Point, Extended, and Surface Defects in Semiconductors ; International School of Materials Science and Technology ; Workshop on Point, Extended, and Surface Defects in Semiconductors
回次:	1988 ; 1988 ; 2nd
会議開催地:	Erice, Italy
会議開催年:	1988.11.02-1988.11.07

類似資料:

1 国際会議録 *RECOMBINATION ACTIVITY OF INDIVIDUAL EXTENDED DEFECTS IN SILICON Cavallini, A., Castaldini, A. Materials Research Society	7 国際会議録 Electronic Levels Induced by Irradiation in 4H-Silicon Carbide Castaldini, A., Cavallini, A., Rigutti, L., Nava, F. Trans Tech Publications
2 国際会議録 Investigatiou of Stacking Faults in Silicon by Induced Current Methods Castaldini,A., Cavallini,A., Poggi,A., Susi,E. Trans Tech Publications	8 国際会議録 Photoluminescence and Optical Beam Induced Current Imaging of Defects Pester,P.D., Wilson,T. Trans Tech Publications
3 国際会議録 *Light-excitation-based spectroscopy of electronic defects in novel materials Castaldini, A., Cavallini, A., Polenta, L. MRS-Materials Research Society	9 国際会議録 Analyses of Compensation Related Defects in II-VI Compounds Castaldini, A., Cavallini, A., Fernandez, P., Fraboni, B., Piqueras, J. MRS - Materials Research Society
4 国際会議録 Dislocation-Related Deep States Induced by Irradiation in HVPE n-GaN Castaldini, A., Cavallini, A., Polenta, L. Materials Research Society	10 国際会議録 Electrical and Optical Properties of Defects by Complementary Spectroscopies Castaldini, A., Cavallini, A., Fernandez, P., Fraboni, B., Piqueras, J., Polenta, L. MRS - Materials Research Society
5 国際会議録 Correlation between Current Transport and Defects in n+/p 6H-SiC Diodes Canino, M., Castaldini, A., Cavallini, A., Moscatelli, F., Nipoti, R., Poggi, A. Trans Tech Publications	11 国際会議録 On the Dirty Contacts on n-type Silicon Castaldini A., Cavalcoli D., Cavallini A. Kluwer Academic Publishers
6 国際会議録 DEFECTS INDUCED BY PROTONS AND ｦﾃ-RAYS IN SEMI-INSULATING GaAs DETECTORS Castaldini, A., Cavallini, A., Papa, C. del, Fuochi, G., Alietti, M., Canali, C., Nava, F., Paccagnella, A., Lanzieri, … MRS - Materials Research Society	12 国際会議録 Electron-Induced Damage Effects in 4H-SiC Schottky Diodes Castaldini, A., Cavallini, A., Nava, F., Fuochi, P.G., Vanni, P. Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12