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Microscopic model of impact ionization in AlxGa1-xSb

著者名:
掲載資料名:
Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3948
発行年:
2000
開始ページ:
200
終了ページ:
205
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435651 [0819435651]
言語:
英語
請求記号:
P63600/3948
資料種別:
国際会議録

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