Blank Cover Image

Novel surface profile measurement with color-coded grating projection

著者名:
掲載資料名:
Photonic Systems and Applications in Defense and Manufacturing
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3898
発行年:
1999
開始ページ:
374
終了ページ:
381
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435002 [0819435007]
言語:
英語
請求記号:
P63600/3898
資料種別:
国際会議録

類似資料:

Liu,W., Wang,Z., Mu,G., Fang,Z.

SPIE-The International Society for Optical Engineering

Yang,X., Wang,Z., Liu,W., Mu,G.

SPIE-The International Society for Optical Engineering

Liu,W., Yu,D., Wang,Z., Wu,G.

SPIE-The International Society for Optical Engineering

S. Wang, P. Mu, S. Dai, W. Liu

Society of Photo-optical Instrumentation Engineers

Yamamoto, M., Tonooka, M., Yoshizawa, T.

SPIE-The International Society for Optical Engineering

Mu,G.-G., Wang,Z.-Q.

SPIE-The International Society for Optical Engineering

Yamamoto, M., Tonooka, M., Yoshizawa, T.

SPIE-The International Society for Optical Engineering

Y. Wang, W. Ren, Z. Tan, Y. Liu, S. Jian

Society of Photo-optical Instrumentation Engineers

Wang,Y.

SPIE-The International Society for Optical Engineering

Wang,Y.

SPIE-The International Society for Optical Engineering

Yamaomoto, M., Yoshizawa, T.

SPIE - The International Society of Optical Engineering

Wang, Z., Liu, H., Mu, G.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12