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Applications of atomic force microscopy to the study of lightguide fibers

著者名:
掲載資料名:
Optics fiber reliability and testing : 19-20 September 1999, Boston, Massachusetts
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3848
発行年:
1999
開始ページ:
144
終了ページ:
150
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434418 [0819434418]
言語:
英語
請求記号:
P63600/3848
資料種別:
国際会議録

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