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The Influence of Stress on the Growth of Titanium Silicide Thin Films on (001) Silicon Substrates

著者名:
Cheng, S. L.
Chang, S. M.
Huang, H. Y.
Peng, Y. C.
Chen, L. J.
Tsui, B. Y.
Tsai, C. J.
Guo, S. S.
さらに 3 件
掲載資料名:
Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
564
発行年:
1999
開始ページ:
9
出版情報:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994713 [1558994718]
言語:
英語
請求記号:
M23500/564
資料種別:
国際会議録

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