Defect States in SiC/GaN- and SiC/AlGaN/GaN-Heterostructures Characterized by Admittance and Photocurrent Spectroscopy

Defect States in SiC/GaN- and SiC/AlGaN/GaN-Heterostructures Characterized by Admittance and Photocurrent Spectroscopy

著者名:

Witte, H.

掲載資料名:

GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

537

発行年:

1999

開始ページ:

G3.71.1

出版情報:

Warrendale, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994430 [1558994432]

言語:

英語

請求記号:

M23500/537

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019847
シリーズID:	PA00000011
会議名:	Symposium on GaN and related alloys
回次:	1998
会議開催地:	Boston, MA, USA
会議開催年:	1998.11.30-1998.12.04

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2 国際会議録 Deep Trap Characterization in GaN Using Thermal and Optical Admittance Spectroscopy KrTschil, A., Witte, H., Lisker, M., Christen, J., Birkle, U., Einfeldt, S., Hommel, D., Topf, M., Meyer, B. K. MRS - Materials Research Society	8 国際会議録 Electrical and Structural Properties of AlGaN/GaN Heterostructures Grown onto 8°-Off-Axis 4H-SiC Epilayers F. Roccaforte, G. Greco, M.H. Weng, F. Giannazzo, V. Raineri Trans Tech Publications
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4 国際会議録 Enhancement of UV-Sensitivity in GaN/GaAs Heterostructures by Si-Doping Lisker, M., Witte, H., Krtschil, A., Christen, J., As, D. J., Schottker, B., Lischka, K. Trans Tech Publications	10 国際会議録 Metalorganic vapor phase epitaxy of ZnO: toward p-type conductivity S. Heinze, A. Dadgar, F. Bertram, A. Krtschil, J. Blasing, H. Witte, S. Tiefenau, T. Hempel, A. Diez, J. Christen, A. … SPIE - The International Society of Optical Engineering
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