Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs

Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs

著者名:

Lisker, M.

掲載資料名:

GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

537

発行年:

1999

開始ページ:

G3.14.1

出版情報:

Warrendale, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994430 [1558994432]

言語:

英語

請求記号:

M23500/537

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019847
シリーズID:	PA00000011
会議名:	Symposium on GaN and related alloys
回次:	1998
会議開催地:	Boston, MA, USA
会議開催年:	1998.11.30-1998.12.04

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2 国際会議録 Deep Trap Characterization in GaN Using Thermal and Optical Admittance Spectroscopy KrTschil, A., Witte, H., Lisker, M., Christen, J., Birkle, U., Einfeldt, S., Hommel, D., Topf, M., Meyer, B. K. MRS - Materials Research Society	8 国際会議録 p- and n-Type Doping of MBE Grown Cubic GaN/GaAs Epilayers As, D. J., Simonsmeier, T., Busch, J., Schottker, B., Lubbers, M., Mimkes, J., Schikora, D., Lischka, K., Kriegseis, W., … MRS - Materials Research Society
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4 国際会議録 Fermi level pinning at GaN-interfaces: Correlation of electrical admittance and transient spectroscopy Witte, H., Krtschil, A., Lisker, M., Rudloff, D., Christen, J., Krost, A., Stutzmann, M., Scholz, F. MRS-Materials Research Society	10 国際会議録 Micro-Raman and Electron Microscopy Analysis of Cubic GaN Layers on(001)GaAs Tabata,A., Enderlein,R., Lima,A.P., Leite,J.R., Lemos,V., Kaiser,S., Schikora,D., Schottker,B., Kohler,U., Lischka,K. Trans Tech Publications
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