Characterization of Defect Structures in 3C-SiC Single Crystals Using Synchrotron White Beam X-ray Topography
- 著者名:
- 掲載資料名:
- III-Nitride, SiC, and Diamond Materials for Electronic Devices : symposium held April, 1996, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 423
- 発行年:
- 1996
- 開始ページ:
- 545
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993266 [1558993266]
- 言語:
- 英語
- 請求記号:
- M23500/423
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society | |
2
国際会議録
CHARACTERIZATION OF DEFECT STRUCTURES IN SiC SINGLE CRYSTALS USING SYNCHROTRON X-RAY TOPOGRAPHY
MRS - Materials Research Society | |
Trans Tech Publications |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |