BEEM and UHV-TEM Studies of PtSi/Si(001)

BEEM and UHV-TEM Studies of PtSi/Si(001)

著者名:

Kavanagh, K. L.

掲載資料名:

Silicide thin films - fabrication, properties, and applications : Symposium held November 27-30, 1995, Boston, Massachusetts, USA

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

402

発行年:

1996

開始ページ:

461

出版情報:

Pittsburgh: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993051 [1558993053]

言語:

英語

請求記号:

M23500/402

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019834
シリーズID:	PA00000011
会議名:	Symposium on silicide thin films
回次:	1995
会議開催地:	Boston, MA, USA
会議開催年:	1995.11.27-1995.11.30

類似資料:

1 国際会議録 A BEEM Study of PtSi Schottky Contacts on Ion-Milled Si Ru, G-P., Detavernier, C., Donaton, R. A., Blondeel, A., Clauws, P., Meirhaeghe, R. L. Van, Cardon, F., Maex, K., Qu, … MRS - Materials Research Society	7 国際会議録 46c. in Situ Transmission Electron Microscopy Studies of Vapor-Liquid-Solid Phase Growth of Si Nanowires Suneel Kodambaka, James B. Hannon, Mark C. Reuter, Rudd M. Tromp, Frances M. Ross American Institute of Chemical Engineers
2 国際会議録 LATERAL VARIATION IN THE SCHOTTKY BARRIER HEIGHT AND OBSERVATION OF CRITICAL LENGTHS AT Au/PtSi/(100)Si AND Au/(100)GaAs DIODES Talin, A. Alec, Ngo, Tue, Williams, R. Stanley, Morgan, Brent A., Ring, Ken M., Kavanagh, Karen L. MRS - Materials Research Society	8 国際会議録 Si(001) Homoepitaxial Growth Tromp, R. M., Theis, W., Bartelt, N. C. MRS - Materials Research Society
3 国際会議録 BEEM INVESTIGATION OF OXIDE AND SULFIDE PASSIVATED GaAs Alec Talin, A., Stanley Williams, R., Kavanagh, Karen L. Materials Research Society	9 国際会議録 Effects of Substrate Misorientati n Direction on Strain Relaxation at InGaAs/GaAs(001) Interfaces Goldman, R. S., Wieder, H. H., Kavanagh, K. L. MRS - Materials Research Society
4 国際会議録 RBS and TEM analysis of Ta silicides on GaAs kavanagh, K. L., Chen, S. H., Palmstrom, C. J., Carter, C. B., Mukherjee, S. D. North-Holland	10 国際会議録 APPLICATIONS OF IN-SITU UHV AND HIGH RESOLUTION TEM TO THE STUDY OF SMALL PARTICLES Avalos-Borja, M., Su, D., Ponce, F.A., Tramontana, J.C., Guo, Q-H., Heinemann, K., Poppa, H., Boudart, M. Materials Research Society
5 国際会議録 *LOW ENERGY ELECTRON MICROSCOPY Tromp, R. M., Reuter, M. C. Materials Research Society	11 国際会議録 LIGHT SCATTERING STUDY OF THE EVOLUTION OF THE SURFACE MORPHOLOGY DURING GROWTH OF InGaAs ON GaAs Lavoie, C., Haveman, B., Nodwell, E., Pinnington, T., Tiedje, T., Goldman, R. S., Kavanagh, K. L., Hutter, J. L., … MRS - Materials Research Society
6 国際会議録 UHV-TEM STUDIES OF LASER-INDUCED DAMAGE IN SILICON Savage, T. S., Xu, P., Ai, R., Dunn, D., Marks, L. D. Materials Research Society	12 国際会議録 TEM AND SEM STUDIES OF MULTIPLE SILICON ON INSULATOR FILMS FOR THREE DIMENSIONAL CIRCUITS Williams, D. A., McMahon, R. A., Ahmed, H., Barfoot, K. M., Godfrey, D. J., Dunne, B., Mathewson, A. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12