Improved figure-of-merit metric for CMOS transistor performance and its application to 0.25-ヲフm CMOS Technologies
- 著者名:
- Chatterjee,A. ( Texas Instruments Inc. )
- Rodder,M.
- Chen,I.-C.
- 掲載資料名:
- Microelectronic Device and Multilevel Interconnection Technology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2636
- 発行年:
- 1995
- 開始ページ:
- 115
- 終了ページ:
- 123
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819420022 [0819420026]
- 言語:
- 英語
- 請求記号:
- P63600/2636
- 資料種別:
- 国際会議録
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