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Defect related recombination processes in low-dimensional structures of ZnCdSe/ZnSe,CdTe/CdMnTe and GaAs/AlGaAs

著者名:
Godlewski,M.
Hommel,D.
Wojtowicz,T.
Karczewski,G.
Kossut,J.
Reginski,K.
Bugajski,M.
Bergman,J.P.
Monemar,B.
さらに 4 件
掲載資料名:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
シリーズ名:
Materials science forum
シリーズ巻号:
258-263
発行年:
1997
巻:
Part3
開始ページ:
1665
終了ページ:
1670
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497898 [0878497897]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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