Erbium-related defects in gallium arsenide.(Invited)
- 著者名:
Peaker,A.R. Coppinger,F. Efeoglu,H. Evans-Freeman,J.H. Maude,D.K. Portal,J.-C. Rutter,P. Sionger,K.E. Scholes,A. Wright,A.C. - 掲載資料名:
- Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 258-263
- 発行年:
- 1997
- 巻:
- Part3
- 開始ページ:
- 1551
- 終了ページ:
- 1558
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497898 [0878497897]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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