Electron paramagnetic resonance of erbium in bulk silicon carbide crystals
- 著者名:
- 掲載資料名:
- Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 258-263
- 発行年:
- 1997
- 巻:
- Part3
- 開始ページ:
- 1539
- 終了ページ:
- 1544
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497898 [0878497897]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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12
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Intrinsic Defects in 6H-SiC Generated by Electron Irradiation at the Silicon Displacement Threshold
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