Influence of fabrication conditions on properties of Si:Er light-emitting structures
- 著者名:
Sobolev,N.A. Emel'yanov,A.M. Nikolaev,Yu.A. Shtel'makh,K.F. Kudryavstev,Yu.A. Sakharov,V.I. Serenkov,I.T. Makovijchuk,M.I. Parshin,E.O. - 掲載資料名:
- Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 258-263
- 発行年:
- 1997
- 巻:
- Part3
- 開始ページ:
- 1527
- 終了ページ:
- 1532
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497898 [0878497897]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
Materials Research Society |
4
国際会議録
Point defect formation wave,ultrafast cluster nucleation,and damage in laser-excited dielectrics
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |