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Hard x-ray phase tomographic investigation of materials using Fresnel diffraction of synchrotron radiation

著者名:
Peix,G. ( Institut National des Sciences Appliquees (France) )
Cloetens,P. ( European Synchrotron Radiation Facility (France) )
Salome,M. ( Institut National des Sciences Appliquees (France) )
Buffiere,J.-Y. ( Institut National des Sciences Appliquees (France) )
Baruchel,J. ( European Synchrotron Radiation Facility (France) )
Peyrin,F. ( Institut National des Sciences Appliquees (France) )
Schlenker,M. ( Lab. Louis Neel/CNRS (France) )
さらに 2 件
掲載資料名:
Developments in x-ray tomography : 28-29 July 1997, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3149
発行年:
1997
開始ページ:
149
終了ページ:
157
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425713 [0819425710]
言語:
英語
請求記号:
P63600/3149
資料種別:
国際会議録

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