Hard x-ray phase tomographic investigation of materials using Fresnel diffraction of synchrotron radiation
- 著者名:
Peix,G. ( Institut National des Sciences Appliquees (France) ) Cloetens,P. ( European Synchrotron Radiation Facility (France) ) Salome,M. ( Institut National des Sciences Appliquees (France) ) Buffiere,J.-Y. ( Institut National des Sciences Appliquees (France) ) Baruchel,J. ( European Synchrotron Radiation Facility (France) ) Peyrin,F. ( Institut National des Sciences Appliquees (France) ) Schlenker,M. ( Lab. Louis Neel/CNRS (France) ) - 掲載資料名:
- Developments in x-ray tomography : 28-29 July 1997, San Diego, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3149
- 発行年:
- 1997
- 開始ページ:
- 149
- 終了ページ:
- 157
- 出版情報:
- Bellingham, Washington: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819425713 [0819425710]
- 言語:
- 英語
- 請求記号:
- P63600/3149
- 資料種別:
- 国際会議録
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