GaAs/AIGaAs complex structures examined by photoreflectance spectroscopy
- 著者名:
- Sek,G. ( Technical Univ.of Wroclaw (Poland) )
- Misiewicz,J. ( Technical Univ.of Wroclaw (Poland) )
- Kaniewska,M. ( Institute of Electron Technology (Poland) )
- Reginski,K. ( Institute of Electron Technology (Poland) )
- Muszalski,J. ( Institute of Electron Technology (Poland) )
- 掲載資料名:
- Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3179
- 発行年:
- 1997
- 開始ページ:
- 137
- 終了ページ:
- 140
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426055 [0819426059]
- 言語:
- 英語
- 請求記号:
- P63600/3179
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
国際会議録
Photoreflectance spectroscopy for investigations of semiconductor structures (Invited Paper)
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |