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Developed wavelength-scanning interferometry and its application for distance measurement

著者名:
掲載資料名:
Smart structures and materials 1998 : Sensory phenomena and measurement instrumentation for smart structures and materials : 2-4 March 1998, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3330
発行年:
1998
開始ページ:
209
終了ページ:
217
出版情報:
Bellingham: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427748 [0819427748]
言語:
英語
請求記号:
P63600/3330
資料種別:
国際会議録

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