Interdiffusion and stress evolution during solid-state amorphization in Ni-Hf thin-film diffusion couples
- 著者名:
- Atzmon, M. ( Department of Nuclear Engineering and Radiological Sciences, Department of Materials Science and Engineering, The University of Michigan )
- Boyer, W.S.L. ( Department of Nuclear Engineering and Radiological Sciences, The University of Michigan )
- 掲載資料名:
- Metastable phases and microstructures : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 400
- 発行年:
- 1996
- 開始ページ:
- 143
- 終了ページ:
- 148
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993037 [1558993037]
- 言語:
- 英語
- 請求記号:
- M23500/400
- 資料種別:
- 国際会議録
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