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Monte Carlo Simulation for Reliability Physics Modeling and Prediction of Scaled (100NM) Silicon MOSFET Devices

著者名:
掲載資料名:
Future trends in microelectronics : reflections on the road to nanotechnology
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
323
発行年:
1996
開始ページ:
227
終了ページ:
236
総ページ数:
10
出版情報:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792341697 [0792341694]
言語:
英語
請求記号:
N11482/323
資料種別:
国際会議録

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