Testing method for microprofile of optical supersmooth surface
- 著者名:
Li,J. ( Jiangxi Academy of Sciences ) Xiao,S. Li,X. Ying,A. Zhang,X. Zhuo,A. - 掲載資料名:
- Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3897
- 発行年:
- 1999
- 開始ページ:
- 398
- 終了ページ:
- 403
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819434999 [081943499X]
- 言語:
- 英語
- 請求記号:
- P63600/3897
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
国際会議録
Inspecting the microprofile and defects of optical surfaces using an atomic-force microscope
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |