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CD-R and CD-RW optical disk characterization in response to intense light sources

著者名:
掲載資料名:
Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3806
発行年:
1999
開始ページ:
84
終了ページ:
92
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432926 [081943292X]
言語:
英語
請求記号:
P63600/3806
資料種別:
国際会議録

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