Novel x-ray and EUV two-dimensional imaging glass-capillary spectrometer for Z-pinch plasma diagnostics
- 著者名:
Kantsyrev,V.L. ( Univ.of Nevada/Reno ) Bauer,B.S. Fedin,D. Shlyaptseva,A. Hansen,S. Paraschiv,I. - 掲載資料名:
- X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3766
- 発行年:
- 1999
- 開始ページ:
- 410
- 終了ページ:
- 417
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432520 [0819432520]
- 言語:
- 英語
- 請求記号:
- P63600/3766
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
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SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |