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X-ray evolving universe spectroscopy mission(XEUS):narrow-field imaging high-resolution spectrometer:II(1 to 10 keV)

著者名:
Korte,P.A.J.de ( Space Research Organization Netherlands )
Hoevers,H.F.C.
Bruijn,M.P.
Bento,A.C.
Mels,W.A.
Bleeker,J.A.M.
Holland,A.D.
Turner,M.J.T.
さらに 3 件
掲載資料名:
X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3766
発行年:
1999
開始ページ:
152
終了ページ:
161
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432520 [0819432520]
言語:
英語
請求記号:
P63600/3766
資料種別:
国際会議録

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