X-ray evolving universe spectroscopy mission(XEUS):narrow-field imaging high-resolution spectrometer instrument:I
- 著者名:
Verhoeve,P. ( European Space Agency/ESTEC ) Peacock,A.J. Bavdaz,M. Martin,D. Rando,N. Poelaert,A. Hartog,R.H.den Duband,L. - 掲載資料名:
- X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3766
- 発行年:
- 1999
- 開始ページ:
- 144
- 終了ページ:
- 151
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432520 [0819432520]
- 言語:
- 英語
- 請求記号:
- P63600/3766
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
X-ray evolving universe spectroscopy mission(XEUS):requirements of the x-ray focal plane instruments
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |