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High-numerical-aperture objective lenses and optical system improved objective type total internal reflection fluorescence microscopy

著者名:
Kawano,Y. ( Olympus America,Inc. )
Abe,C.
Kaneda,T.
Aono,Y.
Abe,K.
Tamurap,K.
Terakawa,S.
さらに 2 件
掲載資料名:
Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4098
発行年:
2000
開始ページ:
142
終了ページ:
151
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437433 [0819437433]
言語:
英語
請求記号:
P63600/4098
資料種別:
国際会議録

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